JEOL JSM-6490LV SEM For Sale

Model Year: 2008
Quantity: 1
Condition: Excellent operational condition
Serial No: Available upon request
Availability: SOLD


  • manufactured in 2008 (Like brand new system)
  • Details specifications and capabilities are available at OEM website link:
  • Equipped with OXFORD INCA EDS Microanalysis


High Vacuum mode: 3.0 nm(30kV)

Low Vacuum mode: 4.0 nm(30kV)

Accelerating Voltage:  0.3 to 30 kV  

Magnification:  x5 to 300,000  

Filament:  Pre-centered W hairpin filament (with continuous auto bias) 

Objective Lens: Super Conical lens

Objective Lens Apertures:  

Click-stop type (3-step variable) 

Fine position controllable in X/Y directions  

Maximum Specimen Size:  8" coverage, 12" specimen can be loaded 

Specimen Stage:

5 axis computer controlled Eucentric goniometer 

X=125mm, Y=100mm, Z=5 to 80mm

T= -10 to 90°, R=360° (endless)  

Display LCD:  20 inch, high resolution FPD 

Vacuum mode changeover:  Automatic (PC interface controlled)




The system is installed in a lab and is in excellent operational condition. For serious inquiries, operational inspection can be arranged. 


Tool relocation services with installation, start up, and training are available and can be quoted upon request.


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