CAMECA SIMS 4550 For Sale

Model Year:	2007
Quantity:	1
Condition:	Excellent operational condition
Serial No:	Available upon request
Availability:	SOLD

Configuration:

Quadrupole SIMS Microprobe for dopant depth profiling and thin layer analysis in semiconductors.

Configuration information is in the attached PDF document.

Comments:

This instrument was purchased brand new in 2007. It has been used very little.  Presently installed and under utilization.  Instrument performance is in full compliance with OEM's original specs.

Full operational inspection can be arranged for serious inquiries.

This is a rare and unique opportunity to acquire this "Like New" instrument at a fraction of original price.  If you are interested, please contact us to further discuss.