JEOL 2010F TEM For Sale

Model Year:	N/A
Quantity:	1
Condition:	Refurbished system
Serial No:	Available upon request
Availability:	SOLD

Configuration:

Base Unit

1. 200kV maximum accelerating voltage with semi-continuous HV control, 50eV/step minimum

2. Electron Gun Assembly

• Schottky FEG Emitter - Zr/W<100>
• Emitter temperature: 1600-1800K
• Probe current approximately 0.5nA/1nm (at FWHM)

3. FasTEM System

FasTEM provides complete fast external computer control of all microscope operating conditions and specimen stage (x and y translation).

4. Specimen Anticontamination Trap

5. Differential Vacuum System utilizing Sputter Ion and Diffusion Pumps, Microprocessor Controlled, featuring "radial evacuation" of the specimen area

6. Eucentric Motorized 5 axis Side Entry Goniometer:

• Side Entry Goniometer
• Analytical (ARP) Pole Piece
• 0.23nm, ±30 deg tilt x or y; 0.12 steradian solid angle; 25° take-off angle
• Encoded X, Y, Z and tilt axes

7. Independently controlled condenser mini lens to allow variable convergence angle selection (JEOL alpha sector)

8. High Contrast Objective Aperture (Lower position in the Objective Lens) for high contrast imaging and/or simultaneous EDS/high resolution/high contrast imaging

9. Independent Lens "Free Run" Control

10. Optimum under focus with variable focus step

11. Automatic through focus

12. Beam Stop

13. Automatic Exposure System for allowing variability of either brightness or time (electron current measuring type with both average and spot metering)

14. Automatic Sheet Film Camera (3W' x 4") including

• light-tight loading and receiving boxes and 100 cassettes (A50N)

15. DHM-40 Digital Hour Meter for instrument time and filament time monitoring

16. External Computer Control Interface

17. Video Printer to record microscope operating conditions

18. Fully Automatic Vacuum System (10- 7 torr) with Penning Gauge

19. Air Compressor

20. EMDSC-U10A Film Desiccator

21. Haskris Water Recirculator (water cooled)

22. One set of operator's manuals
 

Peripheral Equipment

1. Jeol SCANNING IMAGE OBSERVATION DEVICE/ASID (EM-24015)

2. EDAX PHOENIX EDS SYSTEM WITH RETRACTABLE SUTW TEM DETECTOR

• Super Ultra Thin Window for the detection of elements down to and including Beryllium (Z=4)
• Resolution 136 eV or  better measured at 5.9keV / at 1000cps
• Peak to Background 18000:1 or better
• Including preamplifier and cables, and bellows for auto - retraction
• High voltage cut-off switch
• Si(Li) type with active area 30mm2
   

QUALITATIVE MICROANALYSIS SOFTWARE (This is only available from within the EDAX Genesis Software Application):

• Spectrum acquisition and display
• Peak labeling
• KLM line markers
• Automatic and manual peak identification
• Interactive periodic table
• User selectable display colors
• User definable spectral windows or regions of interest

1. QUANTITATIVE THIN FILM TEM MICROANALYSIS SOFTWARE FOR MATERIALS APPLICATIONS : (This is only available from within the EDAX Genesis Software Application)

• State of the art AEM algorithms
• Cliff-Lorimer and thin film approx imation methods
• Experimental and theoretical K-factor determination
• K-factor tables stored to disc
• Choice of methods for theoretical cross sections
• Thin film absorption correction selectable when needed
• Thin film fluorescence correction selectable when needed
• Ox ide stoichiometry calculation routines
• Automatic mode for single key operation
• Integrated acquisition, storage, identification,background subtraction and spectrum processing

2. PHOENIX EDAM III ANALYZER :

• Multi-Channel Analyzer
• Sixteen Digital SCA Outputs
• Dedicated high speed PCI bus
• 8 software selectable time constants
• Two Independent High Voltage channels
• Peak Shift correction for input count rate
• Triple level fast discriminator

3. Gatan Imaging Filter (GIF 2001) operating up to 200keV with grade B 1k x 1k CCD with the following Gatan items:

The GIF 2000 family (2001 & 2002) is the 2nd generation post column energy filter series and is optimized for operation at primary energies from 200 to 400keV. Similar to first generation post column energy filters from Gatan, these GIFs can be attached to the bottom flange of any modern TEM (FEG or Lab6) to form energy filtered images, diffraction patterns, and energy loss spectra. The 2nd generation electron optics of the GIF 2000 family offers fully 2nd order corrected prisms and 3rd order corrections for the major aberrations in the image.

• 805 Pneumatic BF/DF STEM system
• 679.34CK STEM interface electronics
• 700.20P25 HREM software used for autofocus, autostigmation, and auto alignment. (PC)
• 678.35XXX Gate valve controller
• 795-692.U Upgrade 2k camera housing
• 788 DigiScan II
• 820.30000 FireWire adapter for DigiScan II & 794/20 MegaScan CCD
• 794.80V14 DigitalMicrograph software plug-in for 794/20 MegaScan
• 700.80P10 Digita1Montage software (PC)
• 703.0012P Spectrum imaging base package (PC)
• 703.4011P STEM EELS spectrum imaging (PC)
• 703.2010P EFTEM Spectrum Imaging module (PC)
• 703.3010P X-ray Spectrum Imaging module (PC) (EDAX EDS)
• 700.80P14 Software plug-in for 780 DualView
• EM-28060 JEOL 2010 Vibration Isolators for GIF
• EM-20440 JEOL 2010 Function for GIF (ARP polepiece)
• 07976 PCI kit for installing the 780 DualView on the GIF computer

4. Gatan Megascan camera with Grade B 2k x 2k CCD. This is a bottom mount camera located under the Jeol camera chamber and interfaced with the Gatan camera housing.

5. Gatan 780 DualVision camera mounted in the 35mm port. This camera provides a large field-of-view (great low magnification imaging)with simultaneous digital and video TEM imaging. The camera can be manually rotated through 360 degrees and provides images up to 1300 x 1030 pixels with 12-bit dynamic range.
 

TEM Sample Holders:

The Gatan holders include a beryllium Hex ring ,beryllium anti-twist washer, one Hexring tool,one loading jig assembly (for the 925 model), and a specimen rod stand to facilitate specimen loading under a stereo microscope

1. Jeol Single-Tilt Holder with carrying case

2. Gatan 646 Double-Tilt Analytical Holder

3. Gatan 646 Double-Tilt Analytical Holder

4. Gatan 925 Double-Tilt Rotate Holder

• The cradle has a continuous manual rotation in both directions of 360 degrees
• The cradle may be tilted manually ±25° (pole piece dependent)
• Tilt and rotation may be separately adjusted at any orientation of the specimen cradle
• Beryllium specimen cup and Hexrings are provided to minimize the x - ray background during EDX analysis

5. Gatan 646-0300 Second Axis Tilt Control 

Comments:

In excellent working condition.

Installation available worldwide.