KLA-Tencor 7700 Surfscan For Sale
Model Year: | N/A |
Quantity: | 1 |
Condition: | Refurbished system |
Serial No: | Available upon request |
Availability: | SOLD |
Configuration:
KLA Tencor 7700 Patterned / Unpatterned wafer inspection system
- Can detect defects as small as 0.15µm
- Wafer size: 4" - 8"
- 30mW Argon-Ion laser,488nm
- Sensitivity: 0.15 um
- Repeatability: Count error less than 1.5% on a standard deviation
- High sensitivity on after-etch and high topography applications
- Dual collection channels
- Circular input polarization
- Multi scan
- Multi-threshold capability
- Auto learn
- Programmable spatial filer
- Count repeatability error, 1.5% at 1 standard deviation
- Mean count 500, 0.5mm diamater latex spheres standard
- High speed digital signal processing
- Off-axis collection with programmable spatial filter
- Variable collection aperature
- Variable polarization
- Count repeatability error ,1.5% at 1 standard deviation
- Mean count.500, 0.5mm diameter latex spheres standard
System can be purchased in as-is-where-is condition or fully refurbished with original specs guarantee.
Our refurbishment process consists of at least the following:
- New Laser
- Optics and mirrors cleaned or replaced, if required
- Power supply checked and replaced, if required
- Optics alignment
- Full calibration to confirm original specs compliance
Comments:
Complete turn-key solution offered including refurbished system with demonstration at our facility in New Jersey, professional crating and shipping worldwide, installation and warranty support worldwide.
Alternatively, this system can also be purchased in as-is-where-is condition from our ebay store:
http://www.ebay.com/itm/KLA-Tencor-7700-Surfscan-/110870340862?pt=LH_DefaultDomain_0&hash=item19d06324fe
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This product is located at our USA - East Coast HQ facility.