KLA-Tencor AFS 3220FA Mark IV For Sale
|Condition:||Excellent operational condition|
|Serial No:||Available upon request|
- Advanced Flatness System (AFS) measures thickness, flatness and shape of silicon, epi and SOI wafers. Suitable for 130nm and 90nm site flatness technology nodes.
- Configured for 300mm wafers
- Measures etched, polished, epi, SOI and reclaim wafers
- High throughput and sorting
- Reliable edge grip handling
- Integral NIST traceable masters
- 1mm edge exclusion
- Bulk resistivity and conductivity type options.
Full operational inspection can be arranged for serious inquiries
If you are interested in these systems, please contact us to further discuss.