KLA-Tencor AFS 3220FA Mark IV For Sale

Model Year:	2001
Quantity:	1
Condition:	Excellent operational condition
Serial No:	Available upon request
Availability:	SOLD

Configuration:

• Advanced Flatness System (AFS) measures thickness, flatness and shape of silicon, epi and SOI wafers. Suitable for 130nm and 90nm site flatness technology nodes. 
• Configured for 300mm wafers
• Measures etched, polished, epi, SOI and reclaim wafers 
• High throughput and sorting 
• Reliable edge grip handling 
• Integral NIST traceable masters 
• 1mm edge exclusion 
• Bulk resistivity and conductivity type options.

Comments:

Full operational inspection can be arranged for serious inquiries

 

If you are interested in these systems, please contact us to further discuss.